High temperature X-ray diffraction study of Tantalum oxides phases
Houria Chikh-Afir
USTHB- Faculté de Chimie, BP 32 ElAlia– Bab Ezzouar, Alger, Algeria
Email: [email protected]
The structures and lattice parameters of the Tantalum and Ta2O5 phases were determined by high temperature X-ray diffraction under vacuum and low pressure carbon monoxide between 293 and 2278 K. We show that the metallic phase structure is stabilized by inclusion of oxygen into the metal octahedral hole. We determined the crystalline characteristics at high temperatures for Ta and Ta2O5 Phases.
1 NOT UNTIL THE TEMPERATURE DROPS TO 10 DEGREES
11 EFFECTS OF AUSTENITIZATION TEMPERATURE ON THE MICROSTRUCTURE OF
13 NCAC 13 0406 HIGH PRESSURE OR TEMPERATURE LIMIT
Tags: diffraction study, x-ray diffraction, oxides, tantalum, temperature, diffraction, study, phases