HIGH TEMPERATURE XRAY DIFFRACTION STUDY OF TANTALUM OXIDES PHASES

GRINDING TEMPERATURE FIELD PREDICTION BY MESHLESS FINITE BLOCK METHOD
CSIRO SUMMER VACATION SCHOLARSHIP PROJECT REPORT HIGH TEMPERATURE
0 PERFORMANCE ANALYSIS FOR TEMPERATURECOMPENSATED WHITELIGHT INTERFEROMETRIC FIBER SENSORS

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High temperature X-ray diffraction study


High temperature X-ray diffraction study of Tantalum oxides phases


Houria Chikh-Afir

USTHB- Faculté de Chimie, BP 32 ElAlia– Bab Ezzouar, Alger, Algeria

Email: [email protected]




The structures and lattice parameters of the Tantalum and Ta2O5 phases were determined by high temperature X-ray diffraction under vacuum and low pressure carbon monoxide between 293 and 2278 K. We show that the metallic phase structure is stabilized by inclusion of oxygen into the metal octahedral hole. We determined the crystalline characteristics at high temperatures for Ta and Ta2O5 Phases.


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11 EFFECTS OF AUSTENITIZATION TEMPERATURE ON THE MICROSTRUCTURE OF
13 NCAC 13 0406 HIGH PRESSURE OR TEMPERATURE LIMIT


Tags: diffraction study, x-ray diffraction, oxides, tantalum, temperature, diffraction, study, phases